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Spectroscopic and Microscopic Methods for Characterisation of Materials

Credits 5
Hours per week 3 / 1 / 0
Examination C+Ex
Study Language English
Level Bachelor subject
Guarantor prof. RNDr. Ondrej Gedeon, Ph.D., DSc.


The course introduces the basic microscopic and spectroscopic methods used for materials characterization. The course covers energy levels of atoms, molecule, and solid, physical principles of methods and their relation to instruments and sample preparations.


1. Spectrum and its origin, spectroscopic and microscopic methods, cross section, properties of particles and radiation.
2. Elastic and inelastic cross section, Compton scattering, photoelectric effect.
3. Quantum mechanics of atom, hydrogen atom, electron-electron and spin-orbital interaction, splitting of spectral lines.
4. Electron energy levels, atom terms, selection rules, energy bands in solid, Bloch function, quantum tunnelling.
5. Transmission electron microscopy, contrast, bright-field a dark-field observation, sample preparations.
6. Scanning electron microscopy, contrast, backscattered and secondary electrons, sample preparations.
7. Electron microprobe analysis, EDS and WDS configuration, principle of method, qualitative and quantitative analysis, correction methods, mapping.
X-ray fluorescence spectroscopy.
8. Formation, structure, and properties of the surface. Photoelectron spectroscopy, principle of the method, satellite lines, angle-resolved
spectroscopy, ultraviolet photoelectron spectroscopy. Auger spectroscopy, Auger microscopy.
9. Secondary Ion Mass spectrometry for solid, ion scattering, kinematic factor, sputtering yield, ionization probability, depth profiling, SNMS
10. Other ion methods, channelling, proton induced X-ray emission spectroscopy, Rutherford backscattering spectroscopy, low energy ion spectroscopy.
11. Probe microscopies and their principles. Scanning tunnelling microscopy, atomic force microscopy, near-field optical microscopies.
12. Diffraction methods, diffraction of photons, electrons and neutrons. Structural factor. LEED and EBSD, neutron diffraction, X-ray diffraction,
powder diffraction.
13. Vacuum and vacuum instruments. Vacuum measuring and pumps. Particle sources for photons, electrons, ions, and neutrons.
14. Detectors and analysers. Ionization chamber, crystal spectrometer, energy dispersive detector, scintillator, hemispherical analyser, quadrupole
mass analyser, time-of-flight analyser, other detectors and analysers.


Z: Y. Leng, Materials characterization, Wiley, 2008.
Z: R.F. Egerton, Physical principles of electron microscopy, 2005.

UCT Prague
Technická 5
166 28 Prague 6 – Dejvice
IČO: 60461373
VAT: CZ60461373

Czech Post certified digital mail code: sp4j9ch

Copyright: UCT Prague 2017
Information provided by the Department of International Relations and the Department of R&D; technical support by the computing centre.
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